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Dieses Buch ist eine aktualisierte Einführung in die Anwendung der spektrometrischen Ellipsometrie mit ihrem praktischen Einsatz bei der Untersuchung von Grenzflächeneigenschaften, Elektronenstrukturen und Quasiteilcheneigenschaften verschiedener Klassen von Dünnschichtmaterialien.
Auteur
Andrew T. S. Wee is a class of 62 Professor of Physics, and Director of the Surface Science Laboratory at the National University of Singapore (NUS). His research interests are in surface and nanoscale science, scanning tunnelling microscopy (STM) and synchrotron radiation studies of the molecule-substrate interface, graphene and related 2D materials. He was a Commonwealth Fellow as well as a Rhodes Scholar at the University of Oxford, where he received his DPhil (1990). He holds a Bachelor of Arts (Honours) in Physics (1994) as well as a master degree from the University of Cambridge. He is an Associate Editor of the journal ACS Nano and serves or has served on several other journal editorial boards.
Xinmao Yin is Professor of Physics at the Shanghai University, China. He completed his degrees of the bachelor and PhD in Zhejiang University in 2010 and National University in 2015, respectively. His expertise is in the field of condensed matter physics and optical spectroscopy, with primary strength in studying the electronic and spin structures of materials using optical spectroscopic techniques at different energy range. He specializes in studying materials such as 2D transition metal dichalcogenides, High-Tc superconducting cuprates, and colossal magnetoresistance manganites and their interfaces. He is expert in the various optical analysis techniques (ellipsometry, reflectivity, absorption, etc.) and the synchrotron-based spectroscopy (XAS, XMCD, XRD, XPS, ARPES etc.). Using these spectroscopic techniques, the underlying physical mechanism of macroscopic and microscopic properties governing superconductivity, ferromagnetism, phase transition, as well as spin changes, plasma and exciton excitations have been studied.
Chi Sin Tang is scientist at the Institute of Materials Research and Engineering, Agency for Science Technology and Research (A*STAR), Singapore. He holds a Bachelor of Science (Honours) in Physics (2012) as well as a post-graduate diploma in Education from Nanyang Technological University. An expert user of optical techniques such as Spectroscopic Ellipsometry and synchrotron-based spectroscopic measurements that include X-ray Absorption Spectroscopy and Photoemission Spectroscopy, his research interests mainly focus on the electronic and optical properties of low-dimensional materials such as two-dimensional transition metal dichalcogenides, unconventional oxide thin-films and the effects of interfacial interactions.
Résumé
A one-of-a-kind text offering an introduction to the use of spectroscopic ellipsometry for novel material characterization In Introduction to Spectroscopic Ellipsometry of Thin Film Materials: Instrumentation, Data Analysis and Applications, a team of eminent researchers delivers an incisive exploration of how the traditional experimental technique of spectroscopic ellipsometry is used to characterize the intrinsic properties of novel materials. The book focuses on the scientifically and technologically important two-dimensional transition metal dichalcogenides (2D-TMDs), magnetic oxides like manganite materials, and unconventional superconductors, including copper oxide systems. The distinguished authors discuss the characterization of properties, like electronic structures, interfacial properties, and the consequent quasiparticle dynamics in novel quantum materials. Along with illustrative and specific case studies on how spectroscopic ellipsometry is used to study the optical and quasiparticle properties of novel systems, the book includes:
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