Predictive Technology Model for Robust Nanoelectronic Design

This volume explains many of the technical mysteries behind the PTM model adopted worldwide in explorative design research. The author brings a state-of-the-art perspective on technology scaling to this work and shares insights gained through device modeling.

Predictive Technology Model for Robust Nanoelectronic Design explains many of the technical mysteries behind the Predictive Technology Model (PTM) that has been adopted worldwide in explorative design research. Through physical derivation and technology extrapolation, PTM is the de-factor device model used in electronic design. This work explains the systematic model development and provides a guide to robust design practice in the presence of variability and reliability issues. Having interacted with multiple leading semiconductor companies and university research teams, the author brings a state-of-the-art perspective on technology scaling to this work and shares insights gained in the practices of device modeling.

Provides a systematic treatment of predictive modeling and design prototyping, from the fundamental concept to practical benchmarks Includes a complete and quantitative vision on the opportunities and limits of technology scaling toward the 10nm regime Addresses the emergent modeling and design needs under ever-increasing variability and reliability concerns Covers state-of-the-art compact modeling solutions for CMOS alternatives and post-silicon devices, enabling exploratory design activities beyond traditional CMOS Discusses the seamless integration of the process/materials development and circuit simulation that supports concurrent technology-design research Includes supplementary material: sn.pub/extras

Résumé
Predictive Technology Model for Robust Nanoelectronic Design* explains many of the technical mysteries behind the Predictive Technology Model (PTM) that has been adopted worldwide in explorative design research. Through physical derivation and technology extrapolation, PTM is the de-factor device model used in electronic design. This work explains the systematic model development and provides a guide to robust design practice in the presence of variability and reliability issues. Having interacted with multiple leading semiconductor companies and university research teams, the author brings a state-of-the-art perspective on technology scaling to this work and shares insights gained in the practices of device modeling.

Contenu

1. Introduction.- 2. Predictive Technology Model of Conventional CMOS Devices.- 3. Predictive Technology Model of Enhanced CMOS Devices.- 4. Statistical Extraction and Modeling of CMOS Variability.- 5. Modeling of Temporal Reliability Degradation.- 6. Modeling of Interconnect Parasitics.- 7. Design Benchmark with Predictive Technology Model.- 8. Predictive Process Design Kits.- 9. Predictive Modeling of Carbon Nanotube Devices.- 10. Predictive Technology Model for Future Nanoelectronic Design.