Atomic Force Microscopy in Process Engineering

Brings together both the basic theory and proven process engineering practice of AFM. This book takes a rigorous and practical approach that ensures it is directly applicable to process engineering problems. It describes fundamentals and techniques, while specific benefits for process engineering are clearly defined and illustrated.

Auteur
Dr. Nidal Hilal is a Professor of Engineering and Director of NYU Abu Dhabi Water Research Center. He is a Chartered Engineer in the United Kingdom (CEng), a registered European Engineer (Euro Ing), an elected Fellow of both the Institution of Chemical Engineers (FIChemE), and the Learned Society of Wales (FLSW). He received his bachelor's degree in chemical engineering in 1981 followed by a master's degree in advanced chemical engineering from Swansea University in 1986. He received his PhD degree from Swansea University in 1988. In 2005 he was awarded a Senior Doctorate, Doctor of Science degree (DSc), from the University of Wales in recognition of an outstanding research contribution in the fields Water Processing including Desalination and Membrane Science and Technology. He was also awarded, by the Emir of Kuwait, the prestigious Kuwait Prize (Kuwait Medal) of Applied Science for the year 2005 and Menelaus Medal 2020, by the Learned Society of Wales, for excellence in engineering and technology. His research interests lie broadly in the identification of innovative and cost-effective solutions within the fields of nano-water, membrane technology, and water treatment, including desalination, colloid engineering and the nano-engineering applications of AFM. He has published 8 handbooks, 82 invited book chapters, and around 500 articles in the refereed scientific literature. He has chaired and delivered lectures at numerous international conferences and prestigious organizations around the world. Nidal sits on the editorial boards of a number of international journals, is an advisory board member of several multinational organizations, and has served on/consulted for industry, government departments, research councils, and universities on an international basis.

Texte du rabat

Atomic force microscopy (AFM) is a surface imaging technique that can be applied at sub-nanometer resolution in liquids and gases. This book brings together both the basic theory and proven process engineering practice of AFM.

Contenu

Basic Principles of Atomic Force Microscopy; Measurement of Particle and Surface Interactions Using Force Microscopy; Quantification of Particle-Bubble Interactions Using Atomic Force Microscopy; Investigating Membranes and Membrane Processes with Atomic Force Microscopy; AFM and Development of (Bio)Fouling Resistant Membranes; Nanoscale Analysis of Pharmaceuticals by Scanning Probe Microscopy; Micro/Nanoengineering and AFM for Cellular Sensing; Atomic Force Microscopy and Polymers on Surfaces; Application of AFM for the Study of Tensile and Microrheological Properties of Fluids; Future Prospects