EMI Assessment in a Real-World Environment

The objective of the presented work is to develop an approach for measuring electromagnetic interference (EMI) generated by electronic equipment without requiring the measurements to be made inside a shielded anechoic chamber. The basic approach is to identify regions in the spectrum where externally generated signals exist and then to bypass those regions when measuring interference from electronic equipment. An analysis of the received spectrum is used to assess the presence of signals. Trade-offs between measurement accuracy and the time to perform the measurements are given, along with information on measurement repeatability. This technique can be implemented virtually on any type of signal level measuring hardware capable of being operated by a computer. The book is intended to provide electrical engineering researchers and professionals with an innovative technique for EMI assessment without using expensive equipment.

Auteur
Khankin, Maxim Maxim V. Khankin, Bachelor of Science in Metrology and Measurement Techniques at Odessa State Polytechnical University, Ukraine; Master of Science in Electrical Engineering at University of New Hampshire, USA. Product Development Engineer at Allegro Microsystems, Inc., New Hampshire.