Applied Scanning Probe Methods I

This volume examines the physical and technical foundation for recent progress in applied near-field scanning probe techniques. It constitutes a timely comprehensive overview of SPM applications, now that industrial applications span topographic and dynamical surface studies of thin-film semiconductors, polymers, paper, ceramics, and magnetic and biological materials. After laying the theoretical background of static and dynamic force microscopies, including sensor technology and tip characterization, contributions detail applications such as macro- and nanotribology, polymer surfaces, and roughness investigations. The final part on industrial research addresses special applications of scanning force nanoprobes such as atomic manipulation and surface modification, as well as single electron devices based on SPM. Scientists and engineers either using or planning to use SPM techniques will benefit from the international perspective assembled in the book.

First book summarizing the state-of-the-art of this technique Real industrial applications included Includes supplementary material: sn.pub/extras

Auteur
Dr. Bharat Bhushan received an M.S. in mechanical engineering from the Massachusetts Institute of Technology in 1971, an M.S. in mechanics and a Ph.D. in mechanical engineering from the University of Colorado at Boulder in 1973 and 1976, respectively, an MBA from Rensselaer Polytechnic Institute at Troy, NY in 1980, Doctor Technicae from the University of Trondheim at Trondheim, Norway in 1990, a Doctor of Technical Sciences from the Warsaw University of Technology at Warsaw, Poland in 1996, and Doctor Honoris Causa from the Metal-Polymer Research Institute of National Academy of Sciences at Gomel, Belarus in 2000. He is a registered professional engineer (mechanical) and presently an Ohio Eminent Scholar and The Howard D. Winbigler Professor in the Department of Mechanical Engineering, Graduate Research Faculty Advisor in the Department of Materials Science and Engineering, and the Director of the Nanotribology Laboratory for Information Storage & MEMS/NEMS (NLIM) at the Ohio State University, Columbus, Ohio. He is an internationally recognized expert of tribology on the macro- to nanoscales, and is one of the most prolific authors in the field. He is considered by some a pioneer of the tribology and mechanics of magnetic storage devices and a leading researcher in the fields of nanotribology and nanomechanics using scanning probe microscopy and applications to micro/nanotechnology.

Contenu
Part I: Scanning Probe Microscopy.- A. Schirmeisen, B. Ancykowski, H. Fuchs: Dynamic Force Microscopy. J.E. Houston: Interfacial Force Microscopy: Selected Applications. Volker Scherer, Michael Reinstaedtler, Walter Arnold: Atomic Force Microscopy with Lateral Modulation. E.Oesterschulze, R. Kassing: Sensor Technology for Scanning Probe Microscopy. J.S. Villarrubia: Tip Characterization for Dimensional Nanometrology.- Part II: Characterization.- Bharat Bhushan: Micro/Nanotribology and Materials Characterization Studies Using Scanning Probe Microscopy. Sergei Magonov: Visualization of Polymer Structures with Atomic Force Microscopy. Juergen Keller, Dietmar Vogel, Andreas Schubert, and Bernd Michel: Displacement and Strain Field Measurements from SPM Images. Ndubuisi G. Orji, Martha I. Sanchez, Jay Raja, and Theodore V. Vorburger: AFM Characterization of Semiconductor Line Edge Roughness. Redhouane Henda: Mechanical Properties of the Self-Assembled Organic Monolayers: Experimental Techniques and Modeling Approaches. LiShi and Arun Majumdar: Micro-Nano Scale Thermal Imaging Using Scanning Probe Microscopy. Gustavo Luengo, Frederic Leroy: The Science of Beauty at Small Scale. Applications of Scanning Probe Methods on Cosmetic Science.- Part III: Industrial Applications.- S. Hosaka: SPM Based Storage Using Atomic Manipulation and Surface Modification. J. Tominaga: Super Density Optical Data Storage by Near-Field Optics. R. Yamamoto, K. Sanada, S. Umemura. R: Capacitance Storage Using a Ferroelectric Medium and a Scanning Capacitance Microscope (SCM). K. Matsumoto: Room-Temperature Single Electron Devices Formed ba AFM Nano-Oxidation Process.